NextIn Solutions

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Next Inspection Solutions for Semiconductor & FPD Applications

NextIn Solutions is a technology leading company in wafer inspection & metrology systems for the semiconductor and FPD industry. Its unique and proprietary technologies meet or exceed today's top-notch industry requirements.

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AEGIS series provide the most cost-effective solution in defect detection for 2xnm node of semiconductor manufacturing process and beyond. It has BF(Bright Field) and DF(Dark Field) inspection capabilities.

The system uses both dark field and bright field technology for both patterned and unpatterned wafers.

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